发明名称 |
METHOD TO CO-INTEGRATE OPPOSITELY STRAINED SEMICONDUCTOR DEVICES ON A SAME SUBSTRATE |
摘要 |
Methods and structures for forming localized, differently-strained regions in a semiconductor layer on a substrate are described. An initial, unstrained, semiconductor-on-insulator substrate may be processed to form the differently-strained regions in the original semiconductor layer. The differently-strained regions may have opposite types of strain. The strains in the different regions may be formed independently. |
申请公布号 |
US2016079128(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201514955801 |
申请日期 |
2015.12.01 |
申请人 |
STMICROELECTRONICS, INC. ;COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
发明人 |
LOUBET NICOLAS;MAITREJEAN SYLVAIN;WACQUEZ ROMAIN |
分类号 |
H01L21/84;H01L21/266;H01L21/306;H01L21/02;H01L21/762;H01L21/8238;H01L29/78;H01L29/165;H01L21/265;H01L21/324 |
主分类号 |
H01L21/84 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming differently strained regions of semiconductor on a substrate, the method comprising:
forming a first semiconductor layer over a second semiconductor layer, wherein the first semiconductor layer forms under a first strain; implanting ions into a first region and not a second region of the second semiconductor layer, wherein the implanted ions amorphize the first region of the second semiconductor layer; recrystallizing the first region of the second semiconductor layer to form a second strain in the first region; removing the first semiconductor layer; forming a third semiconductor layer in contact with the second region and not in contact with the first region, wherein the third semiconductor layer is of a different chemical composition from the second semiconductor layer; and heating the substrate to condense a chemical component from the third semiconductor layer into the second region of the second semiconductor layer to form a third strain in the second region that is different from the second strain. |
地址 |
Coppell TX US |