发明名称 |
Automated Analytics Systems and Methods |
摘要 |
An automated analytics system can include a sensor system that obtains measurement data by monitoring one or more parameters at each of a number of locations on each of a number of replicated components of an object. A computing device receives the measurement data from the sensor system and uses the measurement data to automatically generate a computerized representation of each of the plurality of replicated components. Thereafter, upon receipt of an input query, the computing device generates a synthesized representation of the object that is specifically directed to a parameter of interest indicated in the query. The synthesized representation may be displayed in a visual format that is interpretable by a human to derive information associated with the parameter of interest. |
申请公布号 |
US2016078673(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201414488873 |
申请日期 |
2014.09.17 |
申请人 |
General Electric Company |
发明人 |
Patrick Romano;Vittal Sameer;Cristofoli Gary;Reimann Johan Michael |
分类号 |
G06T17/00;G06T15/10;G01J5/00 |
主分类号 |
G06T17/00 |
代理机构 |
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代理人 |
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主权项 |
1. An automated analytics method comprising:
using a sensor system to obtain measurement data by monitoring one or more parameters at a plurality of locations on each of a plurality of replicated components of an object; providing to a computing device, the measurement data; using the measurement data to automatically generate in the computing device, a computerized representation of each of the plurality of replicated components; receiving in the computing device, a first input query comprising a first parameter of interest; and responding to the first input query by using the computerized representation of each of the plurality of replicated components to generate a first synthesized representation of the object, the first synthesized representation of the object providing information specifically directed to the first parameter of interest. |
地址 |
Schenectady NY US |