IMAGE INSPECTION DEVICE, IMAGE INSPECTION SYSTEM, AND IMAGE INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To obtain an image inspection device, an image inspection system, and an image inspection method with which it is possible to detect abnormality with higher accuracy or more easily.SOLUTION: An image inspection device according to the present invention comprises: a differential image acquisition unit for acquiring an inspection differential image between a first image of the object surface of an inspection object photographed in a first state by an image-capturing unit and a second image of the object surface of the inspection object photographed in a second state by the image-capturing unit, the image-capturing unit being capable of photographing the object surface in the first state in which light is directed from a first direction inclined to one side to the perpendicular direction of the object surface, and also capable of photographing the object surface in the second state in which light is directed from a second direction inclined to the other side to the perpendicular direction of the object surface; and an abnormality detection unit for comparing, with the inspection differential image, a reference differential image due to a difference between the first image of the object surface of a reference object photographed in the first state by the image-capturing unit and the second image of the object surface of the reference object photographed in the second state by the image-capturing unit, and detecting abnormality.SELECTED DRAWING: Figure 5