发明名称 |
Surface Micro-Machined Infrared Sensor Using Highly Temperature Stable Interferometric Absorber |
摘要 |
A method for manufacturing a surface machined infrared sensor package is disclosed. A semiconductor wafer is provided having a front side surface and a back side surface. A transistor is defined on the substrate front side. A thin film reflector is implanted in the substrate front side, and a sensor is formed on the semiconductor substrate front side adjacent to the reflector. A thin-film absorber is deposited upon the sensor, wherein the thin-film absorber is substantially parallel to the reflector. |
申请公布号 |
US2016079306(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201414484856 |
申请日期 |
2014.09.12 |
申请人 |
Excelitas Technologies Singapore Pte. Ltd. |
发明人 |
Kropelnicki Piotr;Marinescu Radu M.;Karagoezoglu Hermann;Chuan Kai Liang |
分类号 |
H01L27/16;H01L31/0232;H01L31/18;H01L37/02;H01L31/103 |
主分类号 |
H01L27/16 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a surface machined infrared sensor package, comprising the steps of:
providing a semiconductor substrate having a front side surface and a back side surface; defining a transistor on the substrate front side surface; implanting a reflector on the substrate front side surface; forming a sensor on the substrate front side surface adjacent to the reflector; and depositing a thin-film absorber upon the sensor, wherein the thin-film absorber is substantially parallel to the reflector with the sensor disposed there between. |
地址 |
Singapore SG |