发明名称 Surface Micro-Machined Infrared Sensor Using Highly Temperature Stable Interferometric Absorber
摘要 A method for manufacturing a surface machined infrared sensor package is disclosed. A semiconductor wafer is provided having a front side surface and a back side surface. A transistor is defined on the substrate front side. A thin film reflector is implanted in the substrate front side, and a sensor is formed on the semiconductor substrate front side adjacent to the reflector. A thin-film absorber is deposited upon the sensor, wherein the thin-film absorber is substantially parallel to the reflector.
申请公布号 US2016079306(A1) 申请公布日期 2016.03.17
申请号 US201414484856 申请日期 2014.09.12
申请人 Excelitas Technologies Singapore Pte. Ltd. 发明人 Kropelnicki Piotr;Marinescu Radu M.;Karagoezoglu Hermann;Chuan Kai Liang
分类号 H01L27/16;H01L31/0232;H01L31/18;H01L37/02;H01L31/103 主分类号 H01L27/16
代理机构 代理人
主权项 1. A method for manufacturing a surface machined infrared sensor package, comprising the steps of: providing a semiconductor substrate having a front side surface and a back side surface; defining a transistor on the substrate front side surface; implanting a reflector on the substrate front side surface; forming a sensor on the substrate front side surface adjacent to the reflector; and depositing a thin-film absorber upon the sensor, wherein the thin-film absorber is substantially parallel to the reflector with the sensor disposed there between.
地址 Singapore SG