发明名称 Drain Extended CMOS with Counter-Doped Drain Extension
摘要 An integrated circuit containing a diode with a drift region containing a first dopant type plus scattering centers. An integrated circuit containing a DEMOS transistor with a drift region containing a first dopant type plus scattering centers. A method for designing an integrated circuit containing a DEMOS transistor with a counter doped drift region.
申请公布号 US2016079392(A1) 申请公布日期 2016.03.17
申请号 US201514949241 申请日期 2015.11.23
申请人 Texas Instruments Incorporated 发明人 Steinmann Philipp;Chatterjee Amitava;Pendharkar Sameer
分类号 H01L29/66;G06F17/50 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of fabricating an integrated circuit, comprising the step of: forming a drift region between a gate and a drain of a DEMOS transistor; wherein at least 10 percent of a length of said drift region between said gate and said drain consists of a concentration of a first dopant type plus a concentration of scattering centers; and wherein said concentration of said scattering centers is greater than said concentration of said first dopant type divided by 5.
地址 Dallas TX US