发明名称 |
Drain Extended CMOS with Counter-Doped Drain Extension |
摘要 |
An integrated circuit containing a diode with a drift region containing a first dopant type plus scattering centers. An integrated circuit containing a DEMOS transistor with a drift region containing a first dopant type plus scattering centers. A method for designing an integrated circuit containing a DEMOS transistor with a counter doped drift region. |
申请公布号 |
US2016079392(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201514949241 |
申请日期 |
2015.11.23 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Steinmann Philipp;Chatterjee Amitava;Pendharkar Sameer |
分类号 |
H01L29/66;G06F17/50 |
主分类号 |
H01L29/66 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of fabricating an integrated circuit, comprising the step of:
forming a drift region between a gate and a drain of a DEMOS transistor; wherein at least 10 percent of a length of said drift region between said gate and said drain consists of a concentration of a first dopant type plus a concentration of scattering centers; and wherein said concentration of said scattering centers is greater than said concentration of said first dopant type divided by 5. |
地址 |
Dallas TX US |