发明名称 |
SEMICONDUCTOR MANUFACTURING METHOD AND SEMICONDUCTOR MANUFACTURING APPARATUS |
摘要 |
Flash light is emitted from flash lamps to the surface of a semiconductor substrate on which a metal layer has been formed for one second or less to momentarily raise temperature on the surface of the semiconductor substrate including the metal layer and an impurity region to a processing temperature of 1000° C. or more. Heat treatment is performed by emitting flash light to the surface of the semiconductor substrate in a forming gas atmosphere containing hydrogen. By heating the surface of the semiconductor substrate to a high temperature in the forming gas atmosphere for an extremely short time period, contact resistance can be reduced without desorbing hydrogen taken in the vicinity of an interface of a gate oxide film for hydrogen termination. |
申请公布号 |
US2016079085(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201514751309 |
申请日期 |
2015.06.26 |
申请人 |
SCREEN Holdings Co., Ltd. |
发明人 |
AOYAMA Takayuki;KATO Shinichi |
分类号 |
H01L21/324;H01L21/768;H05B3/00;H01L21/04 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor manufacturing method for forming a contact to a semiconductor substrate, the method comprising the steps of:
(a) implanting ions into a region of the semiconductor substrate to form an impurity region; (b) forming a metal layer on said impurity region; and (c) emitting light to said semiconductor substrate on which said metal layer has been formed for one second or less for heating, wherein said step (c) is performed in a forming gas atmosphere containing hydrogen. |
地址 |
Kyoto JP |