| 摘要 |
There is a testing device for testing a particle motion sensor (250). The testing device includes a rotating mechanism; a first rotating plate (220) connected to the rotating mechanism so that the first rotating plate (220) rotates around an orbital axis (Z1); a second or base plate (230) rotatably attached to the first rotating plate (220) at a rotating point, the second plate (230) having a rotational axis (Z2) offset from the orbital axis (Z1) by a predetermined distance (R); and a gripping mechanism (260) attached to the second plate (230) and configured to receive and fix the sensor (250) relative to the second plate (230). The second plate (230) follows a circular around the orbital axis (Z1), the trajectory has a constant attitude with respect to a reference direction on the plane of the first rotating plate. |
