DEVICES UNDER TEST

摘要

In described examples, a system (100) can include device under test (DUT) cells (114). Each DUT cell (114) can include a DUT (116) and switches configured to control a flow of current to the DUT (116). The system (100) can further include a controller (108) configured to execute tests on the DUTs (116). Each of the tests includes applying a measurement condition to a given DUT (116) and concurrently applying a stress condition to the remaining DUTs (116). The tests can provide measurements sufficient to determine a bias thermal instability and a time dependent dielectric breakdown of the given DUT (116).