| 摘要 |
A method for sensing degradation of an organic light emitting display (OLED) includes an initialization step for applying a sensing data voltage to a gate node Ng of a driving TFT DT and applying an initialization voltage to a source node Ns of the driving TFT DT, a boosting step for floating the gate node Ng and the source node Ns of the driving TFT and applying a drain-to-source current of the driving TFT to an organic element OLED, a sensing step for again applying the initialization voltage to the source node of the driving TFT, setting a gate-to-source voltage of the driving TFT depending on a degradation degree of the organic element, and storing the drain-to-source current of the driving TFT determined by the set gate-to-source voltage in a line capacitor Cst, and a sampling step for outputting a voltage stored in the line capacitor as a sensing voltage. The degradation of each sub-pixel P can be determined by sensing unit SU. |
