发明名称 |
Oxide semiconductor film and formation method thereof |
摘要 |
To provide a crystalline oxide semiconductor film, an ion is made to collide with a target including a crystalline In—Ga—Zn oxide, thereby separating a flat-plate-like In—Ga—Zn oxide in which a first layer including a gallium atom, a zinc atom, and an oxygen atom, a second layer including an indium atom and an oxygen atom, and a third layer including a gallium atom, a zinc atom, and an oxygen atom are stacked in this order; and the flat-plate-like In—Ga—Zn oxide is irregularly deposited over a substrate while the crystallinity is maintained. |
申请公布号 |
US9287352(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201414294626 |
申请日期 |
2014.06.03 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei |
分类号 |
H01L29/04;H01L21/02;H01L29/24;H01L29/786;H01L29/66;H01L27/115;C01G15/00 |
主分类号 |
H01L29/04 |
代理机构 |
Robinson Intellectual Property Law Office |
代理人 |
Robinson Intellectual Property Law Office ;Robinson Eric J. |
主权项 |
1. An oxide semiconductor film comprising:
a plurality of plate particles each including indium, gallium, zinc, and oxygen, wherein the plurality of plate particles are arranged irregularly, and wherein the plurality of plate particles each have regularity in atomic arrangement. |
地址 |
Atsuji-shi JP |