发明名称 Packaging devices and methods for semiconductor devices
摘要 Packaging devices and methods for semiconductor devices are disclosed. In some embodiments, a packaging device for a semiconductor device includes a packaging substrate including a semiconductor device mounting region. The packaging device includes a stress isolation structure (SIS) disposed on the packaging substrate proximate a portion of a perimeter of the semiconductor device mounting region.
申请公布号 US9287194(B2) 申请公布日期 2016.03.15
申请号 US201313787714 申请日期 2013.03.06
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hung Wensen
分类号 H01L23/48;H01L21/50;H01L23/16;H01L23/42;H01L23/00;H01L25/065;H01L23/373;H01L23/50 主分类号 H01L23/48
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A packaging device for a semiconductor device, comprising: a packaging substrate having a first semiconductor device mounted in a first semiconductor device mounting region of the packaging substrate, and a second semiconductor device mounted in a second semiconductor device mounting region; a stress isolation structure (SIS) disposed on the packaging substrate proximate a perimeter of each of the first and the second semiconductor device mounting regions; and a cover over the SIS and the packaging substrate, the cover extending beyond a boundary of the SIS, a perimeter portion of the cover being attached to the packaging substrate, the perimeter portion of the cover enclosing the SIS, the cover having a first thickness over the first semiconductor device and a second thickness over the second semiconductor device, the second thickness being different from the first thickness, a composition of the cover being the same along a center axis of the cover, the center axis extending from a lowermost surface of the cover to an uppermost surface of the cover.
地址 Hsin-Chu TW
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