发明名称 |
Packaging devices and methods for semiconductor devices |
摘要 |
Packaging devices and methods for semiconductor devices are disclosed. In some embodiments, a packaging device for a semiconductor device includes a packaging substrate including a semiconductor device mounting region. The packaging device includes a stress isolation structure (SIS) disposed on the packaging substrate proximate a portion of a perimeter of the semiconductor device mounting region. |
申请公布号 |
US9287194(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201313787714 |
申请日期 |
2013.03.06 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hung Wensen |
分类号 |
H01L23/48;H01L21/50;H01L23/16;H01L23/42;H01L23/00;H01L25/065;H01L23/373;H01L23/50 |
主分类号 |
H01L23/48 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A packaging device for a semiconductor device, comprising:
a packaging substrate having a first semiconductor device mounted in a first semiconductor device mounting region of the packaging substrate, and a second semiconductor device mounted in a second semiconductor device mounting region; a stress isolation structure (SIS) disposed on the packaging substrate proximate a perimeter of each of the first and the second semiconductor device mounting regions; and a cover over the SIS and the packaging substrate, the cover extending beyond a boundary of the SIS, a perimeter portion of the cover being attached to the packaging substrate, the perimeter portion of the cover enclosing the SIS, the cover having a first thickness over the first semiconductor device and a second thickness over the second semiconductor device, the second thickness being different from the first thickness, a composition of the cover being the same along a center axis of the cover, the center axis extending from a lowermost surface of the cover to an uppermost surface of the cover. |
地址 |
Hsin-Chu TW |