发明名称 Serializer/deserializer and method for transferring data between an integrated circuit and a test interface
摘要 A serializer/deserializer for communicating with an integrated circuit. The serializer/deserializer includes a serializer configured to serialize, from a parallel format into a serial format, first data to be transferred from an external device to the integrated circuit. The external device is configured to perform testing on the integrated circuit. A deserializer is configured to deserialize, from the serial format into the parallel format, second data to be transferred from the integrated circuit to the external device. A test access port module is configured to receive, from a test interface arranged between the serializer/deserializer and the external device, third data for controlling the serializer and provide, to the test interface, fourth data associated with control of the test interface. The fourth data corresponds to the deserialization of the second data to be transferred from the integrated circuit to the external device.
申请公布号 US9285421(B1) 申请公布日期 2016.03.15
申请号 US201514643083 申请日期 2015.03.10
申请人 Marvell International Ltd. 发明人 Azimi Saeed;Ho Son Hong;Smathers Daniel
分类号 G01R31/317;G01R31/3177;G06F11/22;G01R31/3185 主分类号 G01R31/317
代理机构 代理人
主权项 1. A serializer/deserializer for communicating with an integrated circuit, the serializer/deserializer comprising: a serializer configured to serialize, from a parallel format into a serial format, first data to be transferred from an external device to the integrated circuit, wherein the external device is configured to perform testing on the integrated circuit; a deserializer configured to deserialize, from the serial format into the parallel format, second data to be transferred from the integrated circuit to the external device; and a test access port module configured to (i) receive, from a test interface arranged between the serializer/deserializer and the external device, third data for controlling the serializer and (ii) provide, to the test interface, fourth data associated with control of the test interface, wherein the fourth data corresponds to the deserialization of the second data to be transferred from the integrated circuit to the external device.
地址 Hamilton BM