发明名称 |
METAL GATE STRUCTURE WITH DEVICE GAIN AND YIELD IMPROVEMENT |
摘要 |
The present disclosure provides a semiconductor structure. The semiconductor structure comprises: a semiconductor substrate; and a gate stack disposed on the semiconductor substrate. The gate stack includes: a high-k dielectric material layer; a titanium-rich TiN layer over the high-k dielectric layer; and a metal layer disposed over the titanium-rich TiN layer. The metal layer includes aluminum. |
申请公布号 |
KR20160029776(A) |
申请公布日期 |
2016.03.15 |
申请号 |
KR20160023494 |
申请日期 |
2016.02.26 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHUNG HUNG CHIN;TSAI SHIANG RUNG;LEE HSIEN MING;HUNG CHENG LUNG;WEI HSIAO KUAN |
分类号 |
H01L29/423;H01L29/40;H01L29/49;H01L29/66;H01L29/78 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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