发明名称 METAL GATE STRUCTURE WITH DEVICE GAIN AND YIELD IMPROVEMENT
摘要 The present disclosure provides a semiconductor structure. The semiconductor structure comprises: a semiconductor substrate; and a gate stack disposed on the semiconductor substrate. The gate stack includes: a high-k dielectric material layer; a titanium-rich TiN layer over the high-k dielectric layer; and a metal layer disposed over the titanium-rich TiN layer. The metal layer includes aluminum.
申请公布号 KR20160029776(A) 申请公布日期 2016.03.15
申请号 KR20160023494 申请日期 2016.02.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHUNG HUNG CHIN;TSAI SHIANG RUNG;LEE HSIEN MING;HUNG CHENG LUNG;WEI HSIAO KUAN
分类号 H01L29/423;H01L29/40;H01L29/49;H01L29/66;H01L29/78 主分类号 H01L29/423
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