发明名称 |
Display substrate and method of manufacturing the same |
摘要 |
A display substrate and a method of manufacturing the same. The display substrate includes a substrate including an active area and an inactive area, an organic light-emitting diode (OLED) unit disposed on the active area of the substrate, and a transmittance measurement pattern unit disposed on the inactive area of the substrate. The transmittance measurement pattern unit includes a deposition assistant layer pattern disposed on the substrate. |
申请公布号 |
US9287503(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201514750728 |
申请日期 |
2015.06.25 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Kim Seong Min;Choi Jun Ho |
分类号 |
H01L21/66;H01L51/00;H01L27/32;H01L51/56 |
主分类号 |
H01L21/66 |
代理机构 |
Lewis Roca Rothgerber Christie LLP |
代理人 |
Lewis Roca Rothgerber Christie LLP |
主权项 |
1. A method of manufacturing a display substrate, the method comprising:
forming a TFT on a substrate, the substrate comprising an active area and an inactive area, the forming of the TFT being on the active area of the substrate; forming an OLED electrically connected to the TFT and comprising a first electrode, an organic light-emitting layer and a second electrode; concurrently or simultaneously forming a deposition assistant layer on a first region of the second electrode with a deposition assistant layer pattern on the inactive area of the substrate; concurrently or simultaneously forming a conductive layer electrically connected to the second electrode, the forming of the conductive layer comprising depositing a conductive material on a second region of the second electrode, which excludes the first region, with a transmittance measurement pattern unit, the depositing of the transmittance measurement pattern unit comprising depositing the conductive material on the deposition assistant layer pattern; and measuring transmittance of the transmittance measurement pattern unit to determine whether a defect is present. |
地址 |
Yongin-si KR |