发明名称 METHOD OF CALCULATING A SHIFT VALUE OF A CELL CONTACT
摘要 According to a method for calculating a shift value of a cell contact, a reference region and a correction region can be set on an image of an actual cell block which includes a plurality of cell contacts formed by using a mask. Each of preliminary shift values of the actual cell contacts with respect to target cell contacts in a target cell block to be formed using the mask can be measured based on the image. The preliminary shift values of the actual cell contacts in the reference region can be minimized. Actual shift values of the actual cell contacts in the correction region with respect to the minimized preliminary shift values can be calculated. Therefore, the mask can be corrected by using the accurately calculated shift values so that the cell contacts can be formed in accordance with a design.
申请公布号 KR20160029426(A) 申请公布日期 2016.03.15
申请号 KR20140118933 申请日期 2014.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG, KI HO;CAI SIBO;YANG, SEUNG HUNE
分类号 H01L21/66;H01L21/027 主分类号 H01L21/66
代理机构 代理人
主权项
地址