Test access mechanism, controller, selector, scan router, external data bus

摘要

A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard IEEE 1500 core test wrappers and provides high test data bandwidth to the wrappers from an external tester. The test architecture includes compare circuits that allow for comparison of test response data to be performed within the device. The test architecture further includes a memory for storing the results of the test response comparisons. The test architecture includes a programmable test controller to allow for various test control operations by simply inputting an instruction to the programmable test controller from the external tester. The test architecture includes a selector circuit for selecting a core for testing. Additional features and embodiments of the device test architectures are also disclosed.

主权项

1. An integrated circuit test architecture comprising:
A. functional core circuits; B. a separate wrapper circuit coupled to each core circuit; C. a test access mechanism coupled to each wrapper circuit; D. a test access mechanism controller coupled to each test access mechanism, each test access mechanism having a select input, a scan input, and a scan output; E. test access mechanism selector circuitry having select outputs and a control output, each select output being coupled to the select input of one of the test access mechanism controllers; F. scan router circuitry having a device scan in lead coupled to the scan inputs of the test access mechanism controllers, a device scan out lead selectively coupled to the scan outputs of the test access mechanism controllers, and a control input coupled to the control output of the test access mechanism selector circuitry; and G. an externally accessible input bus coupled to the test access mechanism controller, the test access mechanism selector, and the test access mechanism.