Tester and method for testing a strip of devices

摘要

A tester configured to test a strip of devices is provided. The tester may include a communications system, a plurality of communication lines, a plurality of multiplexors, each multiplexor having at least two outputs, wherein each multiplexor is configured to receive a signal generated by the communications system via one of the plurality of communication lines, and each multiplexor may be selectably coupled to at least two of the devices in the strip of devices. The tester may be configured to index the plurality of communication lines to a first subset of the devices, initiate at least one test, command the devices to generate data for each of the at least one tests, retrieve data from a first set of the devices, and retrieve data from a second set of the devices.

主权项

1. A device, comprising:
a memory; a test circuit operably coupled to the memory and configure to provide data to be stored in the memory during a test of the device; a first external input interface to the device, the first external input interface electrically coupled to the test circuit and configured to provide a command to the test circuit upon receipt of a signal, the first external input interface located on a first side of the device; a first external output interface from the device located on a second side of the device; and a signal line trace electrically connected between the first external input interface and the first external output interface.