发明名称 Apparatus monitoring for abnormalities
摘要 There is provided a monitoring apparatus that monitors abnormalities in a system including a plurality of components or products. The plurality of components or products respectively include a plurality of types of microcapsules that release, due to specific causes, a plurality of marker chemical substances respectively, the marker chemical substances having respectively different ion mobilities. The monitoring apparatus includes an ion mobility sensor that detects the plurality of marker chemical substances. By detecting the marker chemical substances, the monitoring apparatus is capable of identifying the occurrence of an abnormal state, the type of abnormal state, the occurrence location, the extent of the abnormal state, and the like.
申请公布号 US9285341(B2) 申请公布日期 2016.03.15
申请号 US201214343069 申请日期 2012.09.04
申请人 ATONARP INC. 发明人 Sato Tomoyoshi
分类号 G01N27/62;G01M5/00 主分类号 G01N27/62
代理机构 Buchanan Ingersoll & Rooney PC 代理人 Buchanan Ingersoll & Rooney PC
主权项 1. An apparatus that monitors abnormalities in a system including a plurality of components or products disposed in an enclosed or semi-enclosed space, wherein the plurality of components or products respectively includes a plurality of types of capsules, wherein each of the types of capsule releases a unique one of a plurality of marker chemical substances, and each type of capsule releases its unique marker chemical substance due to a specific predetermined cause, and each of the plurality of marker chemical substances has a unique spectrum, the apparatus comprises: a sensor that is capable of detecting the spectrums of the plurality of marker chemical substances by sampling air in the space, a database that includes information of a relationship among the unique spectrums of the plurality of marker chemical substances, the plurality of marker chemical substances, the plurality of components or products, and the specific predetermined cause associated with each of the plurality of marker chemical substances; and a unit that determines an abnormal state of one of the plurality of components or products based on the spectrum detected by the sensor, and the predetermined specific causes registered in the database.
地址 Hachioji-Shi, Tokyo JP