Multi-path reduction for optical time-of-flight

摘要

Described herein are systems and devices for mitigating multi-path interference in optical time-of-flight systems. An input surface is configured with a pattern comprising predominately low albedo material and a plurality of decimated high albedo features. The low albedo material is configured to minimize reflectance of light emitted by an emitter. The high albedo material is configured to reflect more of the light than the low albedo material. The low and high albedo materials, or an additional material, may be used to provide a high albedo material in visible light wavelengths, configured for use as a projection surface.

主权项

1. A device comprising:
a first material configured to reflect less than 40% of incident infrared light at a designated wavelength; a second material configured to reflect more than 70% of incident infrared light at the designated wavelength; and an input surface having a pattern with a total pattern area, the pattern comprising:
the first material configured in a first plurality of features having a first area of more than 51% of the total pattern area;the second material configured in a second plurality of features having a second area of less than 49% of the total pattern area; andwherein the first plurality of features and the second plurality of features are interspersed with one another and the pattern reduces multi-path interference by absorbing incident infrared light at the designated wavelength.