发明名称 Testing apparatus and testing method of electronic device
摘要 A testing apparatus and a testing method of an electronic device are provided. The testing apparatus includes at least two device transfer plates and a testing circuit. The device transfer plates are electrically and respectively connected to corresponding electronic devices and at least two sockets corresponding to the electronic devices. The testing circuit is electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs. According to types of the electronic devices, the testing circuit provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to a bus between the electronic devices respectively corresponding to the device transfer plates.
申请公布号 US9285427(B2) 申请公布日期 2016.03.15
申请号 US201314017317 申请日期 2013.09.04
申请人 Wistron Corporation 发明人 Luo Wen-Hwa;Chen Kuan-Han;Liao Chih-Sheng
分类号 G01R31/28;G01R31/00;G01R31/3185;G01R31/02;G01R31/04;G01R1/073 主分类号 G01R31/28
代理机构 Jianq Chyun IP Office 代理人 Jianq Chyun IP Office
主权项 1. A testing apparatus configured to test a bus between at least two electronic devices on a circuit board, the circuit board comprising at least two sockets, the electronic devices being configured to electrically connect the corresponding sockets on the circuit board, respectively, the testing apparatus comprising: at least two device transfer plates electrically connected to the electronic devices corresponding to the device transfer plates and electrically connected to the sockets corresponding to the electronic devices; and a testing circuit electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs, wherein the testing circuit, according to types of the electronic devices, provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to the bus between the electronic devices respectively corresponding to the device transfer plates, wherein the serial signal wire pairs and the device transfer plates are connected in one-to-one correspondence.
地址 New Taipei TW