发明名称 POWER PROFILING METHOD, POWER PROFILING SYSTEM, AND PROCESSOR-READABLE STORAGE MEDIUM
摘要 A power profiling method, a power profiling system, and a processor-readable storage medium are provided. The power profiling method includes collecting power status information indicating software and hardware statuses of a power domain that operates in a target board according to input test control information, and generating analysis information of power that is consumed by the target board using the collected power status information.
申请公布号 US2016070632(A1) 申请公布日期 2016.03.10
申请号 US201514752872 申请日期 2015.06.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM RAE-SEOK;BANG BYUNG-WOO;YU JUN-YOUNG
分类号 G06F11/30 主分类号 G06F11/30
代理机构 代理人
主权项 1. A power profiling system comprising: an embedded system board configured to collect power status information indicating software and hardware statuses according to test control information; a power measurement unit connected to at least one power line of the embedded system board, the power measurement unit being configured to calculate power consumption measurement information of at least one power domain; and a test management unit connected to the embedded system board and the power measurement unit, the test management unit being configured to receive the calculated power consumption measurement information, to receive the power status information, to transmit the test control information based upon power test scenario information to the embedded system board, and to generate power test reporting information by combining the power status information and the power consumption measurement information.
地址 Suwon-Si KR