发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM FOR PRODUCING NOISE DIFFERENCES BETWEEN POINTS OF TIME
摘要 Provided are a semiconductor device and a semiconductor system, which can increase immunity against noises through tertiary correlated double sampling (CDS). The semiconductor device includes an amplifier that receives noise and a driving signal, resets for each predetermined period of the driving signal and samples the noise to generate first sampled noise. The first sampled noise includes multiple noise differences each occurring between consecutive reset points. A sampler performs second sampling and third sampling on the first sampled noise and performs fourth sampling on the second and third sampled noises. The first sampled noise includes first to third noise differences, the second sampled noise is a difference between the first and second noise differences, the third sampled noise is a difference between the second and third noise differences, and the fourth sampled noise is a difference between the second and third sampled noises.
申请公布号 US2016070381(A1) 申请公布日期 2016.03.10
申请号 US201514750079 申请日期 2015.06.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JUNCHUL;KIM BUMSOO;OUH HYUNKYU;KANG SANG-HYUB;KIM CHADONG;BYUN SANHO;LEE JINCHUL;CHOI YOON-KYUNG
分类号 G06F3/044;H03K3/013 主分类号 G06F3/044
代理机构 代理人
主权项 1. A semiconductor device comprising: an amplifier that receives noise and a driving signal, resets for each predetermined period of the driving signal and samples the noise to generate first sampled noise, wherein the first sampled noise includes multiple noise differences each occurring between consecutive reset points; and a sampler that performs second sampling and third sampling on the first sampled noise to generate second and third sampled noises, respectively, and performs fourth sampling on the second and third sampled noises to generate fourth sampled noise, wherein: the first sampled noise includes first to third noise differences, the second sampled noise is a difference between the first and second noise differences, the third sampled noise is a difference between the second and third noise differences, and the fourth sampled noise is a difference between the second and third sampled noises.
地址 SUWON-SI KR