发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, BONDING MATERIAL AND BONDING MATERIAL FORMATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method, a bonding material and a bonding material formation method, which can bond metal materials by using a bonding material having an intended solidus temperature.SOLUTION: A semiconductor device manufacturing method comprises the steps of: firstly placing a sheet metal 23 on a porous layer 22b formed on a surface of a surface side metal layer 12 of an insulating substrate 1, in which the sheet metal 23 is composed of a second eutectic alloy which is composed of a second metal forming all proportional solid solution alloy with a first metal, and a third metal forming a first eutectic alloy by eutectic reaction with the first metal at a first eutectic point, and has a second eutectic point lower than the first eutectic point; subsequently placing a semiconductor chip 2 on the sheet metal 23; subsequently melting the sheet metal 23 by a heat treatment at a first temperature higher than the second eutectic point and lower than the first eutectic point to impregnate a porous layer 22b; and subsequently melting the porous layer 22b by a heat treatment at a second temperature higher than the first temperature and causing dispersion of the first metal to a fused material of the sheet metal 23 thereby to form a bonding layer of a ternary alloy of first through third metals.SELECTED DRAWING: Figure 3 |
申请公布号 |
JP2016033992(A) |
申请公布日期 |
2016.03.10 |
申请号 |
JP20140156961 |
申请日期 |
2014.07.31 |
申请人 |
FUJI ELECTRIC CO LTD;NISSAN MOTOR CO LTD;CALSONIC KANSEI CORP;SANKEN ELECTRIC CO LTD;TOSHIBA CORP;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY |
发明人 |
TAKAHASHI HIROKI;MURAKAMI YOSHINORI;ANZAI TAKESHI;SATO SHINJI;TANIZAWA HIDEKAZU;HIYAMA KOHEI;KATO FUMIKI |
分类号 |
H01L21/52;B23K20/00;B23K20/24;B23K35/30 |
主分类号 |
H01L21/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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