| 摘要 |
A semiconductor apparatus may include a first normal circuit configured to generate a normal signal while operating in a normal operation, and a test signal generation unit configured to generate a test signal in response to a test control signal. The semiconductor apparatus may include a signal transfer unit configured to transfer one of either the normal signal or the test signal, as an internal signal, to a signal line, and a second normal circuit configured to perform the normal operation in response to receiving the internal signal from the signal line. The semiconductor apparatus may include a test operation circuit configured to perform a test operation in response to receiving the internal signal from the signal line. |
