发明名称 |
Sample Observation Device |
摘要 |
Provided is a sample observation apparatus including a charged particle optical column that, irradiates a sample including an observation target portion that is a concave portion with a charged particle beam at an acceleration voltage, an image generation section that acquires an image including the observation target portion from a signal acquired with irradiation of the charged particle beam, a storage section that stores information representing a relationship between a brightness ratio of a concave portion and its neighboring portion of a reference sample that is irradiated with the charged particle beam at the acceleration voltage and a value that represents a structure of the concave portions of the reference sample in advance, a calculation section that acquires a brightness ratio of the concave portion and its neighboring portion of the image, and a determination section that determines whether or not a defect occurs in the observation target portion based on the information that represents the relationship and the brightness ratio of the image. |
申请公布号 |
US2016071688(A1) |
申请公布日期 |
2016.03.10 |
申请号 |
US201414786039 |
申请日期 |
2014.04.17 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
GOTO Yasunori;YAMAMOTO Takuma |
分类号 |
H01J37/22;H01J37/28 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
1. A sample observation apparatus, comprising:
a charged particle optical column that irradiates a sample including an observation target portion that is a concave portion with a charged particle beam at an acceleration voltage; an image generation section that acquires an image including the observation target portion from a signal acquired with irradiation of the charged particle beam; a storage section that stores information representing a relationship between a brightness ratio of a concave portion and its neighboring portion of a reference sample that is irradiated with the charged particle beam at the acceleration voltage and a value that represents a structure of the concave portions of the reference sample in advance; a calculation section that acquires a brightness ratio of the concave portion and its neighboring portion of the image; and a determination section that determines whether or not a defect occurs in the observation target portion based on the information that represents the relationship and the brightness ratio of the image. |
地址 |
Tokyo JP |