发明名称 Sample Observation Device
摘要 Provided is a sample observation apparatus including a charged particle optical column that, irradiates a sample including an observation target portion that is a concave portion with a charged particle beam at an acceleration voltage, an image generation section that acquires an image including the observation target portion from a signal acquired with irradiation of the charged particle beam, a storage section that stores information representing a relationship between a brightness ratio of a concave portion and its neighboring portion of a reference sample that is irradiated with the charged particle beam at the acceleration voltage and a value that represents a structure of the concave portions of the reference sample in advance, a calculation section that acquires a brightness ratio of the concave portion and its neighboring portion of the image, and a determination section that determines whether or not a defect occurs in the observation target portion based on the information that represents the relationship and the brightness ratio of the image.
申请公布号 US2016071688(A1) 申请公布日期 2016.03.10
申请号 US201414786039 申请日期 2014.04.17
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 GOTO Yasunori;YAMAMOTO Takuma
分类号 H01J37/22;H01J37/28 主分类号 H01J37/22
代理机构 代理人
主权项 1. A sample observation apparatus, comprising: a charged particle optical column that irradiates a sample including an observation target portion that is a concave portion with a charged particle beam at an acceleration voltage; an image generation section that acquires an image including the observation target portion from a signal acquired with irradiation of the charged particle beam; a storage section that stores information representing a relationship between a brightness ratio of a concave portion and its neighboring portion of a reference sample that is irradiated with the charged particle beam at the acceleration voltage and a value that represents a structure of the concave portions of the reference sample in advance; a calculation section that acquires a brightness ratio of the concave portion and its neighboring portion of the image; and a determination section that determines whether or not a defect occurs in the observation target portion based on the information that represents the relationship and the brightness ratio of the image.
地址 Tokyo JP