发明名称 |
PROBE PIN AND ELECTRONIC DEVICE USING THE SAME |
摘要 |
A probe pin has a coil spring having a first end and a second end, a first plunger having a major portion, and a first elastic extension and a second elastic extension that from the major portion in the same direction, and a second plunger forcedly inserted between the first and the second elastic extensions. The first and the second plungers have electric conductivity. The first and the second plungers are inserted from the first and second ends of the coil spring, respectively, so that the first and the second elastic extensions of the first plunger hold the second plunger with the first elastic extension making a forced contact with a surface of the second plunger to form thereat an electric connection between the first and the second plungers. |
申请公布号 |
US2016072202(A1) |
申请公布日期 |
2016.03.10 |
申请号 |
US201414787518 |
申请日期 |
2014.07.18 |
申请人 |
OMRON CORPORATION |
发明人 |
Hemmi Yoshinobu;Sakai Takahiro;Teranishi Hirotada |
分类号 |
H01R4/48 |
主分类号 |
H01R4/48 |
代理机构 |
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代理人 |
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主权项 |
1. A probe pin, comprising:
a coil spring comprising a first end and a second end; a first plunger comprising:
a major portion, anda first elastic extension and a second elastic extension that extends from the major portion in the same direction; and a second plunger forcedly inserted between the first and the second elastic extensions, wherein the first and the second plungers have electric conductivity, and wherein the first and the second plungers are inserted from the first and second ends of the coil spring, respectively, so that the first and the second elastic extensions of the first plunger hold the second plunger with the first elastic extension making a forced contact with a surface of the second plunger to form thereat an electric connection between the first and the second plungers. |
地址 |
Kyoto JP |