METHODS AND APPRATUS FOR SOFT ERROR IMMUNITY TEST IN DIGITAL INTEGRATED CIRCUITS

摘要

The purpose of the present invention is to inspect an influence of radiation on a digital integrated circuit and a tolerance to a soft error. A system for estimating a radiation tolerance of a digital circuit comprises: an inspection target circuit including a plurality of logic circuits and a plurality of scan flip-flops disposed corresponding to the plurality of logic circuits; a radiation generator which generates a radiation for a predetermined time and irradiates the radiation to the inspection target circuit; and a control unit which is connected to the inspection target circuit and the radiation generator, generates a control signal for irradiating the radiation to the inspection target circuit, transmits the control signal to the radiation generator, and controls input/output of the inspection target circuit.