发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE PROCESSING APPARATUS, PROGRAM, AND RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To improve controllability of a composition in a film when forming the film containing a predetermined element, carbon and nitrogen.SOLUTION: A semiconductor device manufacturing method comprises a process of forming a film containing a predetermined element, carbon and nitrogen on a substrate by performing, predetermined times, a cycle including: a step of supplying first process gas containing a predetermined element and a halogen element to the substrate; a step of supplying second process gas composed of three elements of carbon, nitrogen and hydrogen to the substrate; and a step of supplying carbon-containing third process gas to the substrate.SELECTED DRAWING: Figure 4
申请公布号 JP2016034043(A) 申请公布日期 2016.03.10
申请号 JP20150229751 申请日期 2015.11.25
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HASHIMOTO YOSHITOMO;HIROSE YOSHIRO;MATSUOKA TATSURU
分类号 H01L21/318;C23C16/36;C23C16/455;H01L21/31 主分类号 H01L21/318
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