发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE PROCESSING APPARATUS, PROGRAM, AND RECORDING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To improve controllability of a composition in a film when forming the film containing a predetermined element, carbon and nitrogen.SOLUTION: A semiconductor device manufacturing method comprises a process of forming a film containing a predetermined element, carbon and nitrogen on a substrate by performing, predetermined times, a cycle including: a step of supplying first process gas containing a predetermined element and a halogen element to the substrate; a step of supplying second process gas composed of three elements of carbon, nitrogen and hydrogen to the substrate; and a step of supplying carbon-containing third process gas to the substrate.SELECTED DRAWING: Figure 4 |
申请公布号 |
JP2016034043(A) |
申请公布日期 |
2016.03.10 |
申请号 |
JP20150229751 |
申请日期 |
2015.11.25 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HASHIMOTO YOSHITOMO;HIROSE YOSHIRO;MATSUOKA TATSURU |
分类号 |
H01L21/318;C23C16/36;C23C16/455;H01L21/31 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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