发明名称 Semiconductor Device, Driver IC, Display Device, and Electronic Device
摘要 A semiconductor device including a test circuit is miniaturized. The semiconductor device includes r first input terminals (r is an integer of 2 or more), a second input terminal, r functional circuits, a demultiplexer, and a switch circuit. The demultiplexer is a pass transistor logic circuit. R output terminals of the demultiplexer are electrically connected to respective input terminals of the functional circuit and the input terminal is electrically connected to the second input teiminal. Input terminals of the r circuits are electrically connected to the respective first input terminals through the switch circuit. For example, a signal for verification is input to the first input terminal in verification of the functional circuit to operate the demultiplexer. One signal for verification is input to r functional circuits by the demultiplexer.
申请公布号 US2016071463(A1) 申请公布日期 2016.03.10
申请号 US201514837595 申请日期 2015.08.27
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 TAKAHASHI Kei;KOBAYASHI Hidetomo
分类号 G09G3/32;H01L27/32;H03K17/00;H01L29/786 主分类号 G09G3/32
代理机构 代理人
主权项 1. A semiconductor device comprising: r circuits (r is an integer of 2 or more); and a pass transistor logic circuit comprising a demultiplexer, wherein the demultiplexer comprises r output terminals, and wherein each of the r output terminals of the demultiplexer is electrically connected to a corresponding circuit of the r circuits.
地址 Kanagawa-ken JP