发明名称 MATRIX DEVICE, MEASUREMENT METHOD OF CHARACTERISTICS THEREOF, AND DRIVING METHOD THEREOF
摘要 To provide a measurement method of characteristics of an electrical element which causes variation in the luminance of pixels. In a device which includes components (pixels) arranged in a matrix and a wiring and where each component is can supply current to the wiring through an electrical element included in each component, the directions of current in N components capable of supplying current to the wiring are individually set and the current flowing through the wiring is measured N times. Here, the directions of the current flowing through the electrical elements can be changed. In the respective N measurements, combinations of the directions of current in the N components differ from one another. The amount of current flowing through each electrical element is calculated based on current obtained by the N measurements and the combinations of the directions of the current in the N measurements.
申请公布号 US2016071446(A1) 申请公布日期 2016.03.10
申请号 US201514844390 申请日期 2015.09.03
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 MIYAKE Hiroyuki
分类号 G09G3/00;G01R19/10;G09G3/20;G01R19/00 主分类号 G09G3/00
代理机构 代理人
主权项 1. A measurement method comprising the steps of: in a device which includes components arranged in a matrix with N rows (N is an integer greater than or equal to 2) and a wiring, where each component can supply a current to the wiring through a corresponding one of electrical elements included in the components, and where the directions of the current can be changed, individually setting the directions of the currents in N components capable of supplying current to the wiring and measuring the current flowing through the wiring N times, and obtaining the amount of current supplied to the wiring by each of the components by calculating the amount of current flowing through electrical elements based on current I [1] to current I [N] obtained by the N measurements and combinations of the directions of current of the components in the N measurements, wherein combinations of the directions of the current in the N components differ from one another in the respective N measurements, and wherein the amount of current flowing through each of the electrical elements is calculated using polynomials of the current I [1] to the current I [N].
地址 Atsugi-shi JP