| 摘要 |
Disclosed, is a sample preparation apparatus (6B) which is configured to prepare a material sample (900') suitable for X-ray diffraction. The apparatus (6B) comprises a dished sample holder bottom (500) configured to fit within an annular sample holder (400). The dished sample holder bottom (500) has a concave dished surface (501) which is adapted to distribute sample material (900) under pressing forces. A method of preparing a material sample (900') suitable for X-ray diffraction is also disclosed. The method comprises dosing a dished sample holder bottom (500) which is configured to fit within an annular sample holder (400) with sample material (900), wherein the dished sample holder bottom (500) preferably has a concave dished surface (501) which is adapted to distribute sample material (900) under pressing forces. A new leveling device design tool (Fig 12) is also disclosed. The leveling tool minimizes surface contact effects by penetrating the core of the sample and providing random sample grain orientation while evenly distributing material throughout the sample holder bottom. The sample material (900) is lightly pressed, and sample material (900) is distributed within the dished sample holder bottom (500) by virtue of the concave dished surface (501). |
