| 摘要 |
The present invention relates to a system for detecting the boundaries between a plurality of stacked or overlying semitransparent materials having micrometric size, or the boundary between different liquid layers, which is based on the measurement of a second, third or a higher reading out of a non-invasive optical reflectometry process. The invention can be used to detect thicknesses ranging from tens of microns to a few millimeters of a semitransparent material. The invention can further determine the optical properties of liquids or detect the presence of pollutants that are altering said optical properties, the refraction index of either liquid or solid transparent or semi-transparent materials also being included as part of the optical characteristics that can be measured. |
