发明名称 SUBSTRATE PROCESSING DEVICE, AND SUBSTRATE PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing device and a substrate processing method which are arranged to process a substrate by plasma.SOLUTION: The present invention relates to a substrate processing device and a substrate processing method. A substrate processing method according to an embodiment of the present invention comprises the steps of: providing a substrate arranged by alternately laminating an interlayer insulative layer and a sacrificing layer on polycrystalline silicon, in which holes are formed in the interlayer insulative layer and the sacrificing layer; supplying the substrate with a first step gas excited to a plasma state, thereby forming a protection layer on side faces and bottom faces of the holes, and the upper surface of the substrate; supplying the substrate with a second step gas excited to a plasma state, thereby removing the protection layer formed on the side face of each hole; supplying the substrate with a third step gas excited to a plasma state, thereby removing the sacrificing layer exposed from the side face of each hole; and supplying the substrate with a fourth step gas excited to a plasma state, thereby removing the protection layer on the upper surface of the substrate and the bottom face of each hole.SELECTED DRAWING: Figure 2
申请公布号 JP2016034009(A) 申请公布日期 2016.03.10
申请号 JP20140164897 申请日期 2014.08.13
申请人 PSK INC 发明人 SHIN PYONGSOO
分类号 H01L21/3065;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/3065
代理机构 代理人
主权项
地址