发明名称 p型ZnO系半導体層の製造方法、及び、ZnO系半導体素子の製造方法
摘要 PROBLEM TO BE SOLVED: To provide manufacturing methods of a high-quality p-type ZnO semiconductor layer and a high-quality ZnO semiconductor element.SOLUTION: A p-type ZnO semiconductor layer manufacturing method comprises the steps of: forming an Ag-containing n-type ZnO semiconductor single crystal structure (S102a); annealing the n-type ZnO semiconductor single crystal structure while irradiating Zn to form an Ag-doped p-type ZnO semiconductor layer (S102b); forming an n-type ZnO semiconductor layer on a substrate (S101); and forming a p-type ZnO semiconductor layer above the n-type ZnO semiconductor layer by the above-mentioned method (S102).SELECTED DRAWING: Figure 5
申请公布号 JP2016033935(A) 申请公布日期 2016.03.10
申请号 JP20140155670 申请日期 2014.07.31
申请人 スタンレー電気株式会社 发明人 斎藤 千寿;佐野 道宏;加藤 裕幸
分类号 H01L21/363;C23C14/08;C23C14/58;H01L33/28 主分类号 H01L21/363
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