发明名称 SEMICONDUCTOR DEVICE WITH AN ISOLATION GATE AND METHOD OF FORMING
摘要 An embodiment includes a semiconductor device, comprising: a substrate; a continuous diffusion region disposed on the substrate; a first gate structure disposed on the continuous diffusion region; a second gate structure disposed on the continuous diffusion region; an isolation gate structure disposed between the first gate structure and the second gate structure and disposed adjacent to the both the first gate structure and the second gate structure; a first diffusion region of the continuous diffusion region disposed between the first gate structure and the isolation gate structure; a second diffusion region of the continuous diffusion region disposed between the second gate structure and the isolation gate structure; a conductive layer disposed on the first and second diffusion regions; and an isolation gate contact disposed over the isolation gate structure and electrically insulated from the first diffusion region.
申请公布号 US2016071848(A1) 申请公布日期 2016.03.10
申请号 US201514834419 申请日期 2015.08.24
申请人 SENGUPTA Rwik;RODDER Mark S. 发明人 SENGUPTA Rwik;RODDER Mark S.
分类号 H01L27/088;H01L23/535;H01L21/8234;H01L29/06;H01L29/08 主分类号 H01L27/088
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate; a continuous diffusion region disposed on the substrate; a first gate structure disposed on the continuous diffusion region; a second gate structure disposed on the continuous diffusion region; an isolation gate structure disposed between the first gate structure and the second gate structure and disposed adjacent to the both the first gate structure and the second gate structure; a first diffusion region of the continuous diffusion region disposed between the first gate structure and the isolation gate structure; a second diffusion region of the continuous diffusion region disposed between the second gate structure and the isolation gate structure; a conductive layer disposed on the first and second diffusion regions; and an isolation gate contact disposed over the isolation gate structure and electrically insulated from the first diffusion region.
地址 Austin TX US
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