| 摘要 |
The present invention is to provide a fluorescent X-ray analysis device and a sample display method thereof, wherein workability is improved when measuring a plurality of samples or line patterns with the same shape for each predetermined interval, and is easy to confirm that a measurement point is accurate. The fluorescent X-ray analysis device comprises: a sample base (2) on which a sample (S) is installed; a sample movement mechanism which moves the sample base (2); an X-ray source which irradiates the sample with primary X-rays; a detector which detects fluorescent X-rays generated from the sample; an imaging unit which takes an image of the sample on the sample base; a display unit (7) which displays the image on a screen; a pointing device which points and inputs a specific position on the screen; an image processing unit which displays a mark (M) on an input position on the screen; and a control unit which controls the same movement mechanism and the image processing unit, wherein the control unit moves and displays, when the sample base is moved by the sample movement mechanism, the mark on the screen in the same movement direction as that of the sample base by the same movement distance as that of the sample base. |
