发明名称 化学機械的研磨のための透明な多孔性材料
摘要 The invention is directed to a chemical-mechanical polishing pad substrate comprising a porous material having an average pore size of about 0.01 microns to about 1 micron. The polishing pad substrate has a light transmittance of about 10% or more at at least one wavelength of about 200 nm to about 35,000 nm. The invention is further directed to a polishing pad comprising the polishing pad substrate, a method of polishing comprising the use of the polishing pad substrate, and a chemical-mechanical apparatus comprising the polishing pad substrate.
申请公布号 JP5882947(B2) 申请公布日期 2016.03.09
申请号 JP20130116652 申请日期 2013.06.03
申请人 キャボット マイクロエレクトロニクス コーポレイション 发明人 プラサド,アバネシュワー
分类号 H01L21/304;B24B1/00;B24B29/00;B24B37/013;B24B37/24;B24B49/12;B24D7/12 主分类号 H01L21/304
代理机构 代理人
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