发明名称 酸化物半導体膜
摘要 An object is to provide a manufacturing method of an oxide semiconductor film with high crystallinity. Another object is to provide a manufacturing method of a transistor with high field effect mobility. In a manufacturing method of an oxide semiconductor film, an oxide semiconductor film is formed over a substrate in an atmosphere in which oxygen is purposely not contained, and then the oxide semiconductor film is crystallized by a heat treatment in an atmosphere containing oxygen.
申请公布号 JP5882283(B2) 申请公布日期 2016.03.09
申请号 JP20130216213 申请日期 2013.10.17
申请人 株式会社半導体エネルギー研究所 发明人 本田 達也;小俣 貴嗣;野中 裕介
分类号 H01L29/786;H01L21/20;H01L21/363;H01L29/24 主分类号 H01L29/786
代理机构 代理人
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