发明名称 半導体封止用接着剤、半導体封止用フィルム状接着剤、半導体装置の製造方法、および半導体装置
摘要 <P>PROBLEM TO BE SOLVED: To provide an adhesive for sealing a semiconductor capable suppressing generation of a void even when connection is performed at a high temperature of 300&deg;C or higher in which a manufactured semiconductor has excellent connection reliability, and to provide a film-like adhesive for sealing a semiconductor using it, a manufacturing method for a semiconductor apparatus, and a semiconductor apparatus. <P>SOLUTION: The adhesive for sealing the semiconductor contains a compound formed by an epoxy resin (a), an organic acid (b) capable of reacting with the epoxy resin and a curing promoter. The adhesive further contains a polymer component (c) having a weight average molecular weight of 10,000 or more. The polymer component further contains a polyimide (d). <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP5881927(B2) 申请公布日期 2016.03.09
申请号 JP20080262100 申请日期 2008.10.08
申请人 日立化成株式会社 发明人 本田 一尊;榎本 哲也;中村 祐樹
分类号 C08G59/50;C08L63/00;C08L79/08;C08L101/00;H01L21/60;H01L23/29;H01L23/31 主分类号 C08G59/50
代理机构 代理人
主权项
地址