发明名称 半導体装置の製造方法
摘要 A method includes forming first insulating films on first and second faces of a substrate, removing the first insulating film on the second face, forming polysilicon films on the first insulating film on the first face and the second face, forming second insulating films on the polysilicon films on the first face and the second face, etching the second insulating film on the first face using a mask including an opening, removing the second insulating films on the first face and the second face, removing the polysilicon film on the side of the first face and forming a passivation film which protects the polysilicon film on the side of the second face so that the polysilicon film on the side of the second face is not removed in the polysilicon film removing step, after the polysilicon film forming step and before the polysilicon film removing step.
申请公布号 JP5882579(B2) 申请公布日期 2016.03.09
申请号 JP20100278395 申请日期 2010.12.14
申请人 キヤノン株式会社 发明人 中澤 亨
分类号 H01L21/76;H01L21/322 主分类号 H01L21/76
代理机构 代理人
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