| 摘要 |
Exemplary apparatus and method for obtaining information for at least one structure can be provided. For example, it is possible to forward at least one first electro-magnetic radiation to the at least one structure which is external from the apparatus. At least one second electro magnetic radiation provided from the at least one structure (which is based on the first electro-magnetic radiation(s)) can be detected. It is also possible to determine at least one characteristic of the structure(s) based on the second electro-magnetic radiation(s), and obtain data relating to a pressure of at least one portion of the structure(s) based on the characteristic(s). |
