| 摘要 |
The objective of the present invention is to accurately inspect electronic components by effectively introducing light emitted from the electronic components to a measuring unit in the process of inspecting the electronic components. According to the present invention, the inspecting apparatus comprises: an absorption unit for absorbing electronic components; a probe pin touching an electrode of the electronic components absorbed by the absorption unit; a mounting member with an electrode pad electrically connected to the probe pin; an integrating sphere with an opening of which one side is open, and installed on a path where the electronic components send back; a socket member, installed adjacently to the opening of the integrating sphere, and including an insertion unit where the electronic components are inserted and a reflecting surface for reflecting light emitted from the electronic components towards the integrating sphere; and a power providing unit for providing the electrode pad with power, and being in contact with the mounting member. |
