发明名称 |
Analog-to-digital converter with power supply-based reference |
摘要 |
A measurement circuit is provided for measuring the resistance of a variable resistance element biased with an external voltage supply. The measurement circuit includes an analog-to-digital converter (ADC) and a reference generator connected with the ADC. The ADC is operative to receive a reference voltage and a first voltage developed across the variable resistance element, and to generate a digital output signal indicative of a relationship between the first voltage and the reference voltage. The reference generator is operative to generate the reference voltage as a function of the external voltage supply. |
申请公布号 |
US9281833(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201213481909 |
申请日期 |
2012.05.28 |
申请人 |
Avago Technologies General IP (Singapore) Pte. Ltd. |
发明人 |
McNeill Bruce Walter;Windler Peter John;Lim Wei T. |
分类号 |
G01R27/08;H03M1/06;G01K7/24;H03M1/12 |
主分类号 |
G01R27/08 |
代理机构 |
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代理人 |
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主权项 |
1. A measurement circuit for measuring a resistance of a variable resistance element biased with an external voltage supply, the measurement circuit comprising:
an analog-to-digital converter operative to receive a reference voltage and a first voltage developed across the variable resistance element, and to generate a digital output signal indicative of a relationship between the first voltage and the reference voltage, wherein a resistance of the variable resistance element varies with temperature, wherein the digital output signal is a binary code indicative of a ratio of the first voltage developed across the variable resistance element and the reference voltage; and a reference generator coupled with the analog-to-digital converter and operative to generate the reference voltage as a function of the external voltage supply. |
地址 |
Singapore SG |