发明名称 Analog-to-digital converter with power supply-based reference
摘要 A measurement circuit is provided for measuring the resistance of a variable resistance element biased with an external voltage supply. The measurement circuit includes an analog-to-digital converter (ADC) and a reference generator connected with the ADC. The ADC is operative to receive a reference voltage and a first voltage developed across the variable resistance element, and to generate a digital output signal indicative of a relationship between the first voltage and the reference voltage. The reference generator is operative to generate the reference voltage as a function of the external voltage supply.
申请公布号 US9281833(B2) 申请公布日期 2016.03.08
申请号 US201213481909 申请日期 2012.05.28
申请人 Avago Technologies General IP (Singapore) Pte. Ltd. 发明人 McNeill Bruce Walter;Windler Peter John;Lim Wei T.
分类号 G01R27/08;H03M1/06;G01K7/24;H03M1/12 主分类号 G01R27/08
代理机构 代理人
主权项 1. A measurement circuit for measuring a resistance of a variable resistance element biased with an external voltage supply, the measurement circuit comprising: an analog-to-digital converter operative to receive a reference voltage and a first voltage developed across the variable resistance element, and to generate a digital output signal indicative of a relationship between the first voltage and the reference voltage, wherein a resistance of the variable resistance element varies with temperature, wherein the digital output signal is a binary code indicative of a ratio of the first voltage developed across the variable resistance element and the reference voltage; and a reference generator coupled with the analog-to-digital converter and operative to generate the reference voltage as a function of the external voltage supply.
地址 Singapore SG
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