发明名称 Analog-to-digital conversion circuit, and image sensor including the same
摘要 One embodiment of an analog-to-digital converter includes at least one comparator and a restriction circuit. The comparator has first and second input nodes and a connection node. The connection node is one of an internal node and an output node of the comparator. The restriction circuit is electrically connected to the connection node, and the restriction circuit is configured to restrict a voltage of the connection node.
申请公布号 US9282264(B2) 申请公布日期 2016.03.08
申请号 US201414303221 申请日期 2014.06.12
申请人 Samsung Electronics Co., Ltd. 发明人 Park Yu Jin;Yang Han;Lim Sin-Hwan;Choo Kyo Jin;Ham Seog Heon
分类号 H04N5/359;H03K5/08;H03M1/08;H04N5/365;H04N5/335;H04N5/363;H04N5/374;H03M1/12;H03M1/56 主分类号 H04N5/359
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. An image sensor, comprising: a pixel array configured to generate at least one pixel signal; a ramp generator configured to generate a ramp signal; and an analog-to-digital converter configured to receive the ramp signal and the pixel signal, and generate a digital signal representing the pixel signal, the analog-to-digital converter including, at least one comparator, the comparator having an output node configured to output a comparison result signal; anda restriction circuit electrically connected to the output node, the restriction circuit including a switch and a diode, the switch connected in series to the diode, the restriction circuit configured to suppress a change in total current by creating a current path between the output node and one of a ground and a power supply if the comparison result signal changes, the total current being a current flowing through the comparator plus a current flowing through the restriction circuit.
地址 Gyeonggi-do KR