发明名称 Manufacturing method of epitaxial silicon wafer
摘要 A manufacturing method of an epitaxial silicon wafer includes: an epitaxial-film-growth step in which an epitaxial film is grown on a silicon wafer in a reaction container, and a temperature reduction step in which a temperature of the epitaxial silicon wafer is reduced from a temperature at which the epitaxial film is grown. In the temperature reduction step, a temperature reduction rate of the epitaxial silicon wafer is controlled to satisfy a relationship represented by R≦2.0×10-4X−2.9, where X (Ω·cm) represents a resistivity of the silicon wafer, and R (degrees C./min) represents the temperature reduction rate for lowing the temperature of the epitaxial silicon wafer from 500 degrees C. to 400 degrees C.
申请公布号 US9281216(B2) 申请公布日期 2016.03.08
申请号 US201514754762 申请日期 2015.06.30
申请人 SUMCO CORPORATION 发明人 Torigoe Kazuhisa;Ono Toshiaki
分类号 H01L21/322;H01L21/02;C30B25/10;H01L21/20;C30B25/02 主分类号 H01L21/322
代理机构 Greenblum & Bernstein, P.L.C. 代理人 Greenblum & Bernstein, P.L.C.
主权项 1. A manufacturing method of an epitaxial silicon wafer comprising a silicon wafer and an epitaxial film provided on a surface of the silicon wafer, the method comprising: growing the epitaxial film on the silicon wafer in a reaction container; and reducing a temperature of the epitaxial silicon wafer from a temperature at which the epitaxial film is grown, wherein, while reducing the temperature of the epitaxial silicon wafer, a temperature reduction rate of the temperature of the epitaxial silicon wafer is controlled to satisfy a formula R≦2.0×10−4X−2.9 . . . (formula (1)), where X (Ω·cm) represents a resistivity of the silicon wafer, and R (degrees C./min) represents the temperature reduction rate for reducing the temperature of the epitaxial silicon wafer from 500 degrees C. to 400 degrees C.
地址 Tokyo JP