发明名称 |
Manufacturing method of epitaxial silicon wafer |
摘要 |
A manufacturing method of an epitaxial silicon wafer includes: an epitaxial-film-growth step in which an epitaxial film is grown on a silicon wafer in a reaction container, and a temperature reduction step in which a temperature of the epitaxial silicon wafer is reduced from a temperature at which the epitaxial film is grown. In the temperature reduction step, a temperature reduction rate of the epitaxial silicon wafer is controlled to satisfy a relationship represented by R≦2.0×10-4X−2.9, where X (Ω·cm) represents a resistivity of the silicon wafer, and R (degrees C./min) represents the temperature reduction rate for lowing the temperature of the epitaxial silicon wafer from 500 degrees C. to 400 degrees C. |
申请公布号 |
US9281216(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201514754762 |
申请日期 |
2015.06.30 |
申请人 |
SUMCO CORPORATION |
发明人 |
Torigoe Kazuhisa;Ono Toshiaki |
分类号 |
H01L21/322;H01L21/02;C30B25/10;H01L21/20;C30B25/02 |
主分类号 |
H01L21/322 |
代理机构 |
Greenblum & Bernstein, P.L.C. |
代理人 |
Greenblum & Bernstein, P.L.C. |
主权项 |
1. A manufacturing method of an epitaxial silicon wafer comprising a silicon wafer and an epitaxial film provided on a surface of the silicon wafer, the method comprising:
growing the epitaxial film on the silicon wafer in a reaction container; and reducing a temperature of the epitaxial silicon wafer from a temperature at which the epitaxial film is grown, wherein, while reducing the temperature of the epitaxial silicon wafer, a temperature reduction rate of the temperature of the epitaxial silicon wafer is controlled to satisfy a formula R≦2.0×10−4X−2.9 . . . (formula (1)), where X (Ω·cm) represents a resistivity of the silicon wafer, and R (degrees C./min) represents the temperature reduction rate for reducing the temperature of the epitaxial silicon wafer from 500 degrees C. to 400 degrees C. |
地址 |
Tokyo JP |