发明名称 Methods, systems, and articles of manufacture for analyzing a multi-fabric electronic design and displaying analysis results for the multi-fabric electronic design spanning and displaying simulation results across multiple design fabrics
摘要 Disclosed are techniques to analyze multi-fabric designs. These techniques generate a cross-fabric analysis model by at least identifying first design data in a first design fabric of a multi-fabric electronic design using a first session of a first electronic design automation (EDA) tool, update the cross-fabric simulation model by at least identifying second design data in a second design fabric using a second session of a second EDA tool, and determine analysis results for the multi-fabric electronic design using at least the cross-fabric simulation model. Analysis results may be determined using parasitic, electrical, or performance information. Various EDA tools access their respective native design data in their respective domains or design fabrics and have no access to or visibility of non-native design data while these techniques automatically cross the boundaries between multiple design fabrics to accomplish the tasks of analyzing multi-fabric electronic designs or displaying analysis results therefor.
申请公布号 US9280621(B1) 申请公布日期 2016.03.08
申请号 US201414503407 申请日期 2014.10.01
申请人 Cadence Design Systems, Inc. 发明人 Ginetti Arnold;Kohli Vikas;Kukal Taranjit Singh
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Vista IP Law Group, LLP 代理人 Vista IP Law Group, LLP
主权项 1. A computer implemented method for analyzing a multi-fabric design across multiple design fabrics in a multi-fabric design environment, comprising: executing a sequence of instructions by using a processor or processor core executing one or more threads of a computing system to perform a process, the process comprising: generating a cross-fabric analysis model by at least identifying first design data in a first design fabric of a multi-fabric electronic design using a first session of a first electronic design automation (EDA) tool; updating the cross-fabric analysis model by at least identifying second design data in a second design fabric using a second session of a second EDA tool; and determining analysis results for the multi-fabric electronic design using at least the cross-fabric analysis model including one or more symbolic views.
地址 San Jose CA US