| 摘要 |
A substrate storage condition inspecting apparatus includes an illumination device, an imaging device, and a substrate storage condition determining unit. The illumination device includes, on the front side of an opening of a transport container located at an inspecting position, a first illumination portion and a second illumination portion that are spaced apart in the width direction of the opening. The substrate storage condition determining unit detects a pair of high-luminance portions on an inspection image captured by the imaging device, the pair of high-luminance portions being generated in locations circumferentially spaced apart in the peripheral edge portion of the semiconductor substrate by light applied by the first illumination portion and the second illumination portion, and determines whether or not the storage orientation of the semiconductor substrate is abnormal on the basis of the positional correspondence in the vertical direction for the pair of high-luminance portions. |
