Test probe structures and methods including positioning test probe structures in a test head

摘要

The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.

主权项

1. A test probe structure comprising:
a tip portion; a handle portion spaced a distance away from the tip portion; a body bend portion positioned between the tip portion and the handle portion; an intermediate portion positioned between the body bend portion and the handle portion; the body bend portion including a curved shape extending from the intermediate portion to the tip portion; the tip portion being offset from a longitudinal axis defined by the intermediate portion; the test probe structure defining a length and including a cross-sectional area that is different at a plurality of positions along the length; and wherein the handle portion has a cross-sectional area that is greater than that of the intermediate portion.