发明名称 複合基板の製造方法および半導体デバイスの製造方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a composite substrate which is capable of manufacturing a semiconductor device at a high yield even with a composite substrate in which at least any one of a part of an intermediate layer and a part of a support substrate is exposed. <P>SOLUTION: The method of manufacturing a composite substrate includes the steps of: preparing a first composite substrate 1 which contains a support substrate 10, an intermediate layer 20 that is arranged on at least a part of a main surface thereof, and a group III nitride layer 30a arranged on at least a part of a main surface thereof, with a main surface of the group III nitride layer 30a and at least any one of a part of the main surface of the intermediate layer 20 and a part of the main surface of the support substrate 10 being exposed; obtaining a second composite substrate 2 by selectively removing an exposed portion of the intermediate layer 20 of the first composite substrate 1 by etching; and obtaining a third composite substrate 3 by selectively removing an exposed portion of the main surface of the support substrate 10 of the second composite substrate 2 down to a predetermined depth by etching. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5879964(B2) 申请公布日期 2016.03.08
申请号 JP20110257611 申请日期 2011.11.25
申请人 住友電気工業株式会社 发明人 石原 邦亮;松原 秀樹
分类号 H01L33/20;H01L33/32 主分类号 H01L33/20
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