发明名称 Semiconductor device and method of forming thick encapsulant for stiffness with recesses for stress relief in FO-WLCSP
摘要 A semiconductor device has a semiconductor die mounted to a carrier. A first encapsulant is deposited over the semiconductor die and carrier. A stiffening support member can be disposed over the carrier around the semiconductor die. A plurality of channels or recesses is formed in the first encapsulant. The recesses can be formed by removing a portion of the first encapsulant. Alternatively, the recesses are formed in a chase mold having a plurality of extended surfaces. A second encapsulant can be deposited into the recesses of the first encapsulant. The carrier is removed and an interconnect structure is formed over the semiconductor die and first encapsulant. The thickness of the first encapsulant provides sufficient stiffness to reduce warpage while the recesses provide stress relief during formation of the interconnect structure. A portion of the first encapsulant and recesses are removed to reduce thickness of the semiconductor device.
申请公布号 US9281259(B2) 申请公布日期 2016.03.08
申请号 US201314079273 申请日期 2013.11.13
申请人 STATS ChipPAC, Ltd. 发明人 Lin Yaojian;Chen Kang;Caparas Jose Alvin;Omandam Glenn
分类号 H01L23/48;H01L23/52;H01L29/40;H01L23/31;H01L23/00;H01L21/56 主分类号 H01L23/48
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A method of making a semiconductor device, comprising: providing a first semiconductor die; molding an encapsulant over the semiconductor die to include a recess molded in the encapsulant; forming an interconnect structure over the semiconductor die; and reducing a thickness of the encapsulant to remove the recess.
地址 Singapore SG